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IDT have developed a unique factory testing procedure for scanning Double Crystal Monochromators.
A laser beam is shone through the DCM to simulate an x-
The scanning performance of the DCM can be tested by driving the DCM through the energy range and measuring the exit beam angle with the quad diode detector. This can be done under vacuum conditions at a fixed beam offset with coolant flowing, giving a very close indication of the true DCM beamline performance.
Our monochromator quad diode testing makes it possible to obtain the parasitic beam
walk effects at the factory and to optimise for x-